KLA Tencor 5XX TeraStar

Reticle defect inspection scanner cutaway.

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KLA Tencor reticle inspection cutaway

KLA Tencor 5XX TeraStar cutaway

Reticle defect inspection scanning system used in semiconductor chip production.
Scanner closeup

Image Data

  • Client: KLA Tencor Milpitas, CA
  • Agency: N/A
  • Format: Digital (Illustrator & Photoshop)
  • Use: Collateral
  • Photography: N/A
  • Alt. View: Line Art and TeraScan

All Images Copyright © Kevin Hulsey, Kevin Hulsey Illustration, Inc. (KHulsey.com), all rights reserved.